CRE Module

Surface Measurement and Analysis System

Scheduled for release in mid 2014, the CRE (Convection Reflow Emulation) Module is an add-on module for the TherMoiré AXP and Studio PS400 systems powered by the Studio Software. The CRE Module addresses the semiconductor industry requirement for maximum resolution surface measurement and effective reflow emulation with optimized top/bottom temperature uniformity, while utilizing convection heating.

The CRE Module enhances Akrometrix's industry-standard shadow moiré measurement technique and offers Z displacement measurement from 2.5 microns down to sub-micron resolution. The CRE Module is the fourth add-on module for the expandable TherMoiré platform.